Roy L. Millar: search on Z-Library

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1

Statistical simulation of random dopant induced threshold voltage fluctuations for 35nm channel length MOSFET

Kovac, Urban, Reid, Dave, Millar, Campbell, Roy, Gareth, Roy, Scott, Asenov, Asen

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 636 KB

english, 2008

2

Evaluation of statistical variability in 32 and 22 nm technology generation LSTP MOSFETs

B. Cheng, S. Roy, A.R. Brown, C. Millar, A. Asenov

Journal:

Solid-State Electronics

Year:

2009

Language:

english

File:

PDF, 592 KB

english, 2009

3

Analysis of Threshold Voltage Distribution Due to Random Dopants: A 100 000-Sample 3-D Simulation Study

Reid, D., Millar, C., Roy, G., Roy, S., Asenov, A.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 1.52 MB

english, 2009

4

Faujasite catalysis of aromatic nitrations with dinitrogen pentoxide. The effect of aluminium content on catalytic activity and regioselectivity. The nitration of pyrazole †

Claridge, Robert P., Lancaster, N. Llewellyn, Millar, Ross W., Moodie, Roy B., Sandall, John P. B.

Journal:

Journal of the Chemical Society Perkin Transactions 2

Year:

2001

Language:

english

File:

PDF, 107 KB

english, 2001

5

Zeolite catalysis of aromatic nitrations with dinitrogen pentoxide

Claridge, Robert P., Llewellyn Lancaster, N., Millar, Ross W., Moodie, Roy B., Sandall, John P. B.

Journal:

Journal of the Chemical Society Perkin Transactions 2

Year:

1999

Language:

english

File:

PDF, 93 KB

english, 1999

6

[IEEE Electrical Performance of Electronic Packaging - Austin, TX (2004.10.27-2004.10.27)] Electrical Performance of Electronic Packaging IWCE-04 - Tracking the propagation of individual ions through ion channels with nano-MOSFETs

Millar,, Asenov,, Brown,, Roy,

Year:

2004

Language:

english

File:

PDF, 155 KB

english, 2004

7

[IEEE 2008 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2008) - Hakone-Machi, Kanagawa (2008.09.9-2008.09.11)] 2008 International Conference on Simulation of Semiconductor Processes and Devices - Prediction of random dopant induced threshold voltage fluctuations in NanoCMOS transistors

Reid, Dave, Millar, Campbell, Roy, Gareth, Roy, Scott, Sinnott, Richard, Stewart, Gordon, Stewart, Graeme, Asenov, Asen

Year:

2008

Language:

english

File:

PDF, 1.66 MB

english, 2008

8

[IEEE 2010 IEEE Custom Integrated Circuits Conference -CICC 2010 - San Jose, CA, USA (2010.09.19-2010.09.22)] IEEE Custom Integrated Circuits Conference 2010 - Modeling and simulation of transistor and circuit variability and reliability

Asenov, A., Chen, B., Dideban, D., Kovac, U., Moezi, N., Millar, C., Roy, G., Brown, A. R., Roy, S.

Year:

2010

Language:

english

File:

PDF, 629 KB

english, 2010

9

Letters

Russell, John, Young, Elizabeth, Roebuck, Roy, Browne, Robin, David, Saul, Hughes‐Wilson, J N, Reese, Peter, Wayper, C L, Millar, Alan C, Hammond, Keith

Journal:

The RUSI Journal

Year:

2000

Language:

english

File:

PDF, 679 KB

english, 2000

10

ChemInform Abstract: Asymmetric Synthesis of HCV and HPV Drug Candidates on Scale: The Choice Between Enantioselective and Diastereoselective Syntheses

Jeremy D. Cobb, Bob E. Cooley, Roy C. Flanagan, Mary M. Jackson, Lynda A. Jones, Richard T. Matsuoka, Alan Millar, Daniel E. Patterson, Matthew J. Sharp, Jennifer F. Toczko, et al. et al.

Journal:

Year:

2011

File:

PDF, 18 KB

2011

11

The evolution of standard cell libraries for future technology nodes

James Alfred Walker, James A. Hilder, Dave Reid, Asen Asenov, Scott Roy, Campbell Millar, Andy M. Tyrrell

Journal:

Genetic Programming and Evolvable Machines

Year:

2011

Language:

english

File:

PDF, 1.34 MB

english, 2011

12

Tracking the Propagation of Individual Ions Through Ion Channels with Nano-MOSFETs

C. Millar, A. Asenov, A. R. Brown, S. Roy

Journal:

Journal of Computational Electronics

Year:

2005

Language:

english

File:

PDF, 432 KB

english, 2005

13

Continuum vs. particle simulations of model nano-pores

C. Millar, S. Roy, O. Beckstein, M. S. P. Sansom, A. Asenov

Journal:

Journal of Computational Electronics

Year:

2007

Language:

english

File:

PDF, 385 KB

english, 2007

14

Brownian simulation of charge transport in α-Haemolysin

C. Millar, R. Madathil, O. Beckstein, M. S. P. Sansom, S. Roy, A. Asenov

Journal:

Journal of Computational Electronics

Year:

2008

Language:

english

File:

PDF, 620 KB

english, 2008

15

Induction and identification of sativan and vestitol as two phytoalexins from Lotus corniculatus

Morris R. Bonde, Roy L. Millar, John L. Ingham

Journal:

Year:

1973

Language:

english

File:

PDF, 202 KB

english, 1973

16

Generic Particle-Mesh Framework for the Simulation of Ionic Channels

C. Millar, A. Asenov, S. Roy, J.M. Cooper

Journal:

Journal of Computational Electronics

Year:

2002

Language:

english

File:

PDF, 361 KB

english, 2002

17

Brownian Ionic Channel Simulation

C. Millar, A. Asenov, S. Roy

Journal:

Journal of Computational Electronics

Year:

2003

Language:

english

File:

PDF, 246 KB

english, 2003

18

948. The reaction of 3-bromo-4-iodotoluene with magnesium and lithium

Hinton, Roy C., Mann, Frederick G., Millar, Ian T.

Journal:

Journal of Chemical Sciences (Bangalore)

Year:

1958

Language:

english

File:

PDF, 474 KB

english, 1958

19

Flexor carpi radialis myocutaneous flap

Derek Gordon, James Small, Roy Millar

Journal:

British Journal of Plastic Surgery

Year:

1992

Language:

english

File:

PDF, 97 KB

english, 1992

20

Accounting for medical variation: The case of prescribing activity in a New Zealand general practice sample

Peter B. Davis, Roy Lay Yee, John Millar

Journal:

Social Science & Medicine

Year:

1994

Language:

english

File:

PDF, 871 KB

english, 1994

21

Understanding LER-Induced MOSFET Variability—Part I: Three-Dimensional Simulation of Large Statistical Samples

Reid, D., Millar, C., Roy, S., Asenov, A.

Journal:

IEEE Transactions on Electron Devices

Year:

2010

Language:

english

File:

PDF, 734 KB

english, 2010

22

Understanding LER-Induced MOSFET Variability—Part II: Reconstructing the Distribution

Reid, D., Millar, C., Roy, S., Asenov, A.

Journal:

IEEE Transactions on Electron Devices

Year:

2010

Language:

english

File:

PDF, 702 KB

english, 2010

23

Statistical Enhancement of the Evaluation of Combined RDD- and LER-Induced Variability: Lessons From Sample Simulations

Reid, D., Millar, C., Roy, S., Asenov, A.

Journal:

IEEE Transactions on Electron Devices

Year:

2011

Language:

english

File:

PDF, 937 KB

english, 2011

24

[IEEE ESSDERC 2012 - 42nd European Solid State Device Research Conference - Bordeaux, France (2012.09.17-2012.09.21)] 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - An advanced statistical compact model strategy for SRAM simulation at reduced VDD

Asenov, P., Reid, D., Roy, S., Millar, C., Asenov, A.

Year:

2012

Language:

english

File:

PDF, 1.87 MB

english, 2012

25

FET based nano-pore sensing: a 3D simulation study

Moore, I., Millar, C., Roy, S., Asenov, A.

Journal:

Journal of Computational Electronics

Year:

2012

Language:

english

File:

PDF, 1.07 MB

english, 2012

26

Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP

Binjie Cheng, Dideban, D., Moezi, N., Millar, C., Roy, G., Xingsheng Wang, Roy, S., Asenov, A.

Journal:

IEEE Design & Test of Computers

Year:

2010

Language:

english

File:

PDF, 878 KB

english, 2010

27

[IEEE 2011 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Osaka, Japan (2011.09.8-2011.09.10)] 2011 International Conference on Simulation of Semiconductor Processes and Devices - The effect of compact modelling strategy on SNM and Read Current variability in Modern SRAM

Asenov, P., Adamu-Lema, F., Roy, S., Millar, C., Asenov, A., Roy, G., Kovac, U., Reid, D.

Year:

2011

Language:

english

File:

PDF, 816 KB

english, 2011

28

A Catalyzed and Highly Selective Ester Reduction in the Synthesis of an N -Acylpyrrolidine: Safe Design through Reaction Calorimetry and Modeling

Flanagan, Roy C., Xie, Shiping, Millar, Alan

Journal:

Organic Process Research & Development

Year:

2008

Language:

english

File:

PDF, 290 KB

english, 2008

29

[IEEE Third IEEE International Conference on e-Science and Grid Computing (e-Science 2007) - Bangalore, India (2007.12.10-2007.12.13)] Third IEEE International Conference on e-Science and Grid Computing (e-Science 2007) - Towards a Grid-Enabled Simulation Framework for Nano-CMOS Electronics

Han, Liangxiu, Asenov, Asen, Berry, Dave, Millar, Campbell, Roy, Gareth, Roy, Scott, Sinnott, Richard, Stewart, Gordon

Year:

2007

Language:

english

File:

PDF, 722 KB

english, 2007

30

[IEEE 2011 Design, Automation & Test in Europe - Grenoble (2011.03.14-2011.03.18)] 2011 Design, Automation & Test in Europe - Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis

Merrett, M, Asenov, P, Yangang Wang,, Zwolinski, M, Reid, D, Millar, C, Roy, S, Zhenyu Liu,, Furber, S, Asenov, A

Year:

2011

Language:

english

File:

PDF, 299 KB

english, 2011

31

Malignant Cough Equivalent Asthma: Definition and Case Reports

Millar, Mark M, McGrath, Kris G, Patterson, Roy

Journal:

Annals of Allergy, Asthma & Immunology

Year:

1998

Language:

english

File:

PDF, 170 KB

english, 1998

32

A Patient Referred for Evaluation of Angioedema

Millar, Mark M, Patterson, Roy

Journal:

Annals of Allergy, Asthma & Immunology

Year:

1998

Language:

english

File:

PDF, 160 KB

english, 1998

33

THE JAPANESE PHOENIX [with COMMENT]

W. THEO ROY and T.B. Millar

Journal:

International Journal on World Peace

Year:

1985

Language:

english

File:

PDF, 1.35 MB

english, 1985

34

[IEEE 2009 10th International Conference on Ultimate Integration on Silicon (ULIS - Aachen, Germany (2009.03.18-2009.03.20)] 2009 10th International Conference on Ultimate Integration of Silicon - Efficient simulations of 6σ VT distributions due to Random Discrete Dopants

Reid, Dave, Millar, Campbell, Roy, Gareth, Roy, Scott, Asenov, Asen

Year:

2009

Language:

english

File:

PDF, 664 KB

english, 2009

35

[IEEE 2008 IEEE Fourth International Conference on eScience (eScience) - Indianapolis, IN, USA (2008.12.7-2008.12.12)] 2008 IEEE Fourth International Conference on eScience - Secure, Performance-Oriented Data Management for nanoCMOS Electronics

Sinnott, R. O., Bayliss, C., Davenhall, C., Harbulot, B., Jones, M., Millar, C., Roy, G., Roy, S., Stewart, G., Watt, J., Asenov, A.

Year:

2008

Language:

english

File:

PDF, 2.24 MB

english, 2008

36

Accurate Statistical Description of Random Dopant-Induced Threshold Voltage Variability

Millar, Campbell, Reid, David, Roy, Gareth, Roy, Scott, Asenov, Asen

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 575 KB

english, 2008

37

[IEEE 5th IEEE Conference on Nanotechnology, 2005. - Nagoya, Japan (July 11-15, 2005)] 5th IEEE Conference on Nanotechnology, 2005. - Simulating the bio-nano-CMOS interface

Millar, C., Roy, S., Brown, A.R.

Year:

2005

Language:

english

File:

PDF, 377 KB

english, 2005

38

[IEEE 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Glasgow, United Kingdom (2013.09.3-2013.09.5)] 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models

Asenov, Plamen, Roy, Scott, Asenov, Asen, Reid, Dave, Millar, Campbell, New, David

Year:

2013

Language:

english

File:

PDF, 3.96 MB

english, 2013

39

[IEEE 2008 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2008.06.15-2008.06.16)] 2008 IEEE Silicon Nanoelectronics Workshop - An accurate statistical analysis of random dopant induced variability in 140,000 13nm MOSFETs

Reid, Dave, Millar, Campbell, Roy, Scott, Roy, Gareth, Sinnott, Richard, Stewart, Gordon, Stewart, Graeme, Asenov, Asen

Year:

2008

Language:

english

File:

PDF, 1.20 MB

english, 2008

40

[IEEE 2009 Proceedings of the European Solid State Device Research Conference (ESSDERC) - Athens, Greece (2009.09.14-2009.09.18)] 2009 Proceedings of the European Solid State Device Research Conference - Understanding LER-induced statistical variability: A 35,000 sample 3D simulation study

Reid, Dave, Millar, Campbell, Roy, Gareth, Roy, Scott, Asenov, Asen

Year:

2009

Language:

english

File:

PDF, 1.29 MB

english, 2009

41

[IEEE 2008 IEEE International Symposium on Parallel and Distributed Processing with Applications (ISPA) - Sydney, Australia (2008.12.10-2008.12.12)] 2008 IEEE International Symposium on Parallel and Distributed Processing with Applications - Integrating Security Solutions to Support nanoCMOS Electronics Research

Sinnott, R., Bayliss, C., Doherty, T., Martin, D., Millar, C., Stewart, G., Watt, J., Asenov, A., Roy, G., Roy, S., Davenhall, C., Harbulot, B., Jones, M.

Year:

2008

Language:

english

File:

PDF, 1.33 MB

english, 2008

42

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Advanced simulation of statistical variability and reliability in nano CMOS transistors

Asenov, A., Roy, S., Brown, R. A., Roy, G., Alexander, C., Riddet, C., Millar, C., Cheng, B., Martinez, A., Seoane, N., Reid, D., Bukhori, M. F., Wang, X., Kovac, U.

Year:

2008

Language:

english

File:

PDF, 1.18 MB

english, 2008

43

[IEEE ESSDERC 2008 - 38th European Solid-State Device Research Conference - Edinburgh, UK (2008.09.15-2008.09.19)] ESSDERC 2008 - 38th European Solid-State Device Research Conference - Evaluation of intrinsic parameter fluctuations on 45, 32 and 22nm technology node LP N-MOSFETs

Cheng, B., Roy, S., Brown, A. R., Millar, C., Asenov, A.

Year:

2008

Language:

english

File:

PDF, 780 KB

english, 2008

44

[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Statistical variations in 32nm thin-body SOI devices and SRAM cells

Cheng, B., Roy, S., Brown, A., Millar, C., Asenov, A.

Year:

2008

Language:

english

File:

PDF, 4.25 MB

english, 2008

45

THE DECAY OF Bi 208

Millar, C. H., Eastwood, T. A., Roy, J. C.

Journal:

Canadian Journal of Physics

Year:

1959

Language:

english

File:

PDF, 524 KB

english, 1959

46

[IEEE 2010 International Workshop on Computational Electronics (IWCE) - Pisa, Italy (2010.10.26-2010.10.29)] 2010 14th International Workshop on Computational Electronics - Brownian noise in FET based nano-pore sensing: A 3D simulation study

Moore, I., Millar, C., Roy, S., Asenov, A.

Year:

2010

Language:

english

File:

PDF, 691 KB

english, 2010

47

[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - Combining process and statistical variability in the evaluation of the effectiveness of corners in digital circuit parametric yield analysis

Asenov, P., Kamsani, N. A., Reid, D., Millar, C., Roy, S., Asenov, A.

Year:

2010

Language:

english

File:

PDF, 1.26 MB

english, 2010

48

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Capturing intrinsic parameter fluctuations using the PSP compact model

Cheng, B, Dideban, D, Moezi, N, Millar, C, Roy, G, Wang, X, Roy, S, Asenov, A

Year:

2010

Language:

english

File:

PDF, 1.34 MB

english, 2010

49

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Statistical enhancement of combined simulations of RDD and LER variability: What can simulation of a 105 sample teach us?

Reid, Dave, Millar, Campbell, Roy, Gareth, Roy, Scott, Asenov, Asen

Year:

2009

Language:

english

File:

PDF, 1.00 MB

english, 2009

50

Book reviews

Davies, R. W., Millar, James R., Laird, Roy D., Amann, Ronald, Dienes, Leslie, Butler, W. E., Kiralfy, Albert, Williams, Beryl, Brinkley, George A., Hirszowicz, L., Hollingsworth, Barry, Brock, Peter,

Journal:

Year:

1973

Language:

english

File:

PDF, 1.55 MB

english, 1973